“TI公司日前发布了一款新的开发工具TSW1100，可以节省高速应用的设计时间与开发成本，实现对TI高速、高分辨率的模数转换器（ADC）的快速数据捕捉。用户用新的数据采集卡及软件可以轻松评测ADC性能如信噪比（SNR），保存原始数据或性能曲线以便进一步分析。从而使用户能快速选
”| NEW TI TOOL SIMPLIFIES AND ACCELERATES HIGH-SPEED DESIGNS DALLAS (August 23, 2005) -- Texas Instruments Incorporated (TI) (NYSE: TXN) introduced today a new tool that saves design time and development cost in high-speed applications, allowing for fast digital data capture from TI's high-speed, high-resolution analog-to-digital converters (ADC). The new data capture card and software allow the user to easily evaluate ADC performance and quickly select the best device for their application in systems such as 2.5G/3G wireless base stations, communications and test and measurement equipment. (See www.ti.com/sc05173 for more information.)  The TSW1100 features data capture speeds of up to 170 megasamples per second (MSPS), resolution of up to 16 bits and data capture depths of up to 1 million points. It can operate in single-channel or dual-channel mode, allowing synchronous capture of a dual-channel ADC. Data is transferred via Universal Serial Bus (USB) interface, allowing easy control from a personal computer, and it requires only one wall-mounted power supply for operation. In the past, analyzing ADC performance often required investing in a costly logic analyzer and performing complex analysis routines. For select high performance TI ADCs, the TSW1100 makes those steps unnecessary, providing accurate data with its embedded logic analyzer mode. With the accompanying software, users quickly compute ADC performance metrics such as signal-to-noise ratio (SNR) and spurious free dynamic range (SFDR). The software also allows the user to save the raw data set or performance graphs for future analysis. |
NEW TI TOOL SIMPLIFIES AND ACCELERATES HIGH-SPEED DESIGNS DALLAS (August 23, 2005) -- Texas Instruments Incorporated (TI) (NYSE: TXN) introduced today a new tool that saves design time and development cost in high-speed applications, allowing for fast digital data capture from TI's high-speed, high-resolution analog-to-digital converters (ADC). The new data capture card and software allow the user to easily evaluate ADC performance and quickly select the best device for their application in systems such as 2.5G/3G wireless base stations, communications and test and measurement equipment. (See www.ti.com/sc05173 for more information.) The TSW1100 features data capture speeds of up to 170 megasamples per second (MSPS), resolution of up to 16 bits and data capture depths of up to 1 million points. It can operate in single-channel or dual-channel mode, allowing synchronous capture of a dual-channel ADC. Data is transferred via Universal Serial Bus (USB) interface, allowing easy control from a personal computer, and it requires only one wall-mounted power supply for operation. In the past, analyzing ADC performance often required investing in a costly logic analyzer and performing complex analysis routines. For select high performance TI ADCs, the TSW1100 makes those steps unnecessary, providing accurate data with its embedded logic analyzer mode. With the accompanying software, users quickly compute ADC performance metrics such as signal-to-noise ratio (SNR) and spurious free dynamic range (SFDR). The software also allows the user to save the raw data set or performance graphs for future analysis. |
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